Test Universe 4.00 available

Note: Most test modules offered in Test Universe 4.00 may be used offline (e.g. create, modify and view test documents incl. Control Center documents; get to know the features of a test module) even if a license is not present for them. A license per module and test set is needed to carry out a live test. For evaluation purposes, please contact your distributor/representative for a time limited license file.

Test Universe software updates are free of charge from version 2.0 or higher. If you still work with a version prior to 2.0 please contact your distributor/representative or the OMICRON office nearest you for pricing information.

Update information

To benefit from the latest update please download Test Universe 4.00 and its updates.
Alternatively you can order this software on DVD.

Note: For users still running Test Universe under Microsoft Windows XP – Test Universe 3.10 is the latest compatible version.


TestUniverse_4.00_x64.exe (2 GB)

Windows 7 (64 bit), Windows 8 (64 bit), Windows 8.1 (64 bit), Windows 10 (64 bit)

TestUniverse_4.00_x86.exe (2 GB)

Windows 7 (32 bit), Windows 8 (32 bit), Windows 8.1 (32 bit), Windows 10 (32 bit)

What’s New

The new Test Universe 4.00 offers various new features and improvements.

  • Power and Advanced Power test modules
  • Auto-Save for Control Center tests
  • Restructured Start Page, also presenting ADMO, RelaySimTest and CMControl-P
  • All test modules installed and usable offline even without module license (license per CMC needed for actual test)
  • ADMO (single-place) included
    with unrestricted free test set management
    other ADMO features fully usable without license until end of 2019 (afterwards read-only without license)

Power modules:

These test modules aim at testing all applications which focus at and/or are assessed in the complex power domain P,Q resp. S, phi. The applications to be tested range from load shedding and stability functions like Q-V protection to power swing blocking to generator and motor protection as well as admittance testing (e.g. zero-sequence admittance protection against ground faults).

  • Complex power view P,Q
  • Complex zones/elements, definition similar to the way impedance zones are defined in Distance
  • Shots, defined as P,Q or S, phi
  • Ramps, defined in the P,Q plane (Advanced Power only)
  • Linear smooth or step ramps changing P and Q (line) or S and phi (arc) • Linear frequency change supported for ramps
  • Constant voltage or constant current model
  • R,X impedance view with impedance zones (e.g. distance protection), also transformed into and shown in the P,Q power view (Advanced Power only)
  • Test repetition with statistical analysis (Advanced Power only)
  • Mirrored/scaled currents for a second current triple, to avoid pick-up of differential elements during test shots (Advanced Power only)